Jeffrey Svajlenko, Chanchal K. Roy. Efficiently Measuring an Accurate and Generalized Clone Detection Precision using Clone Clustering. In Jerry Gou, editor, The 28th International Conference on Software Engineering and Knowledge Engineering, SEKE 2016, Redwood City, San Francisco Bay, USA, July 1-3, 2016. pages 426-433, KSI Research Inc. and Knowledge Systems Institute Graduate School, 2016. [doi]
Abstract is missing.