Pan Tiejun, Zheng Leina, Fang Chengbin. Defect Tracing System Based on Orthogonal Defect Classification. In International Conference on Computer Science and Software Engineering, CSSE 2008, Volume 2: Software Engineering, December 12-14, 2008, Wuhan, China. pages 574-577, IEEE Computer Society, 2008. [doi]
Abstract is missing.