Row-linear feedback shift register-column x-masking technique for simultaneous testing of many-core system chips

W. C. Wang, C. Y. Hsu, J. Chien-Mo Li, Y.-C. Sung, A. Rao, L.-T. Wang. Row-linear feedback shift register-column x-masking technique for simultaneous testing of many-core system chips. IET Computers & Digital Techniques, 5(4):238-246, 2011. [doi]

Abstract

Abstract is missing.