Xiao Xuan, David Lo, Xin Xia, Yuan Tian. Evaluating defect prediction approaches using a massive set of metrics: an empirical study. In Roger L. Wainwright, Juan Manuel Corchado, Alessio Bechini, Jiman Hong, editors, Proceedings of the 30th Annual ACM Symposium on Applied Computing, Salamanca, Spain, April 13-17, 2015. pages 1644-1647, ACM, 2015. [doi]
Abstract is missing.