Takahiro Yamane, Ryuya Ohno, Yuko Osana. Similarity-Based Image Retrieval Considering Size and Color of Artifacts by Self-Organizing Map with Refractoriness. In IEEE International Conference on Systems, Man, and Cybernetics, Manchester, SMC 2013, United Kingdom, October 13-16, 2013. pages 1150-1156, IEEE, 2013. [doi]
Abstract is missing.