Zhe Zhang, Michael A. Turi, José G. Delgado-Frias. SRAM leakage in CMOS, FinFET and CNTFET technologies: leakage in 8t and 6t sram cells. In Erik Brunvard, Ken Stevens, Joseph R. Cavallaro, Tong Zhang 0002, editors, Great Lakes Symposium on VLSI 2012, GLSVLSI'12, Salt Lake Cit, UT, USA, May 3-4, 2012. pages 267-270, ACM, 2012. [doi]
Abstract is missing.