Incorporating Rich Features into Deep Knowledge Tracing

Liang Zhang, Xiaolu Xiong, Siyuan Zhao, Anthony Botelho, Neil T. Heffernan. Incorporating Rich Features into Deep Knowledge Tracing. In Claudia Urrea, Justin Reich, Candace Thille, editors, Proceedings of the Fourth ACM Conference on Learning @ Scale, L@S 2017, Cambridge, MA, USA, April 20-21, 2017. pages 169-172, ACM, 2017. [doi]

Abstract

Abstract is missing.