Abstract is missing.
- Behavioral modeling of solute tracking in microfluidicsYi Zeng, Farouk Azizi, Carlos H. Mastrangelo. 1-6 [doi]
- Virtual skin: a behavioral approach helps verificationBenjamin Nicolle, Arnaud Legendre, Louis Ferrero, Leonhard Zastrow. 7-12 [doi]
- VHDL-AMS modeling of adaptive electrostatic harvester of vibration energy with dual-output DC-DC converterAndrii Dudka, Dimitri Galayko, Philippe Basset. 13-18 [doi]
- VHDL-AMS behavioural modelling of a CMUT elementSamuel Frew, Hadi Najar, Edmond Cretu. 19-24 [doi]
- Event driven analog modeling for the verification of PLL frequency synthesizersYifan Wang, Christoph van Meersbergen, Hans-Werner Groh, Stefan Heinen. 25-30 [doi]
- Analog behavior refinement in system centric modelingYaseen Zaidi, Christoph Grimm, Jan Haase. 31-36 [doi]
- System level modeling of smart power switches using SystemC-AMS for digital protection concept verificationHans-Peter Kreuter, Vladimir Kosel, Michael Glavanovics, Robert Illing. 37-42 [doi]
- Simulation-based hierarchical sizing and biasing of analog firm IPsFarakh Javid, Ramy Iskander, Marie-Minerve Louërat. 43-48 [doi]
- AMS static voltage level checkMarcelo Silva. 49-53 [doi]
- An enhanced macromodeling approach for differential output driversTing Zhu, Paul D. Franzon. 54-59 [doi]
- Analysis and extraction of parametric variation effects on microelectrofluidics-based biochipsBao Liu. 60-65 [doi]
- Mixed signal system design verification accelerated with detector-based diagnostic methodDirk Dammers, Christian Domingues, Daniel Schollän, Lars Michael Voßkämper. 66-72 [doi]
- Powering embedded CMOS logic on MEMS-based micro-robotsJung H. Cho, Mark G. Arnold. 73-77 [doi]
- Mixed-signal test development using open standard modeling and description languagesPing Lu, Daniel Glaser, Gürkan Uygur, Susanne Weichslgartner, Klaus Helmreich, A. Lechner. 78-83 [doi]
- Full system verification of CAN network at high speed transmission rate using VHDL-AMSThang Nguyen, Martin Duregger, Georg Pelz. 84-89 [doi]
- Fast and waveform independent characterization of current source modelsChristoph Knoth, Veit B. Kleeberger, Petra Nordholz, Ulf Schlichtmann. 90-95 [doi]
- A modeling methodology for verifying functionality of a wireless chipJesse Chen. 96-101 [doi]
- Prediction of Harmonic Distortion in ADCs using dynamic Integral Non-Linearity modelHamza Fraz, Niclas Bjorsell, J. Stevenson Kenney, Roland Sperlich. 102-107 [doi]
- Supporting dimensional analysis in SystemC-AMSTorsten Mähne, Alain Vachoux. 108-113 [doi]
- VHDL-AMS Statistical Analysis for marginal probabilitiesJoachim Haase, Christoph Sohrmann. 114-119 [doi]
- The PRAISE approach for accelerated transient analysis applied to wire modelsDaniel Zaum, Stefan Hoelldampf, Markus Olbrich, Erich Barke, Ingmar Neumann, Sebastian Schmidt. 120-125 [doi]