ICTSS 2010: 22nd IFIP Int. Conf. on Testing Software and Systems (formerly TestCom/FATES) 2010

November 8, 2010-November 10, 2010 in Natal, Brazil

Call for Papers



22nd IFIP International Conference on Testing Software and Systems (ICTSS)

November 8 - 10, 2010, Natal, Brazil

http://ictss2010.dimap.ufrn.br/ictss/



ICTSS is the merge of the 22nd IFIP Int. Conference on Testing of Communicating Systems (TESTCOM) and the 10th Int. Workshop on Formal Approaches to Testing of Software (FATES). ICTSS is a forum for researchers, developers, testers, and users to review, discuss, and learn about new approaches, concepts, theories, methodologies, tools, and experiences in the field of testing of general software and systems. ICTSS will be co-located with 13th Brazilian Symposium on Formal Methods and 4th Brazilian Workshop on Software Testing.

TOPICS OF INTEREST * Aspects of testing: test derivation, test selection, test coverage, test implementation and execution, test result analysis, test oracles, test management, monitoring and run-time verification, testing frameworks

  • Model-based testing using automata, state machines, process algebra, logics, SDL, UML, Markov-chains, and other formalisms

  • Various types of testing: functional, interoperability, performance, conformance, security, reliability, robustness, etc

  • Application specific testing, e.g., testing of communicating systems and protocols, middleware, networks, web services and applications, wireless applications, control systems, business information systems, embedded and real-time software

  • Tools supporting testing activities

  • Case studies and industrial applications of testing methodologies and testing tools

TYPES OF CONTRIBUTIONS * Full research and industrial papers (max. 16 pages). Research papers should contain theory- or application-oriented results which must be original, significant, and sound; they will undergo a usual reviewing process.  Industrial papers should emphasize practical software testing and/or report open challenges; they will undergo a separate reviewing process. Full papers will be published in LNCS (guidelines: http://www.springer.de/comp/lncs/authors.html). The authors of best papers will be invited to submit extended versions of their papers for a special issue of an international journal (under negotiation).

  • Short papers (max. 6 pages) describing recent research activities, practical experience, and preliminary results that are worth discussing. Short papers will be published as a Technical Report of CRIM with an ISBN number available online.

  • Tutorial proposals (3 pages).

IMPORTANT DATES April 26, 2010: Abstract submission May 3, 2010: Full paper submission July 1, 2010: Notification of acceptance July 15, 2010: Camera-ready version

July 19, 2010: Short paper submission September 9, 2010: Notification of acceptance

July 19, 2010: Tutorial proposals August 9, 2010: Notification of acceptance

PROGRAM COMMITTEE CHAIRS Alexandre Petrenko, CRIM, Canada Jose Carlos Maldonado, U of Sao Paulo, Brazil Adenilso Simao, U of Sao Paulo, Brazil

PROGRAM COMMITTEE Paul Baker, Motorola, UK Antonia Bertolino, ISTI-CNR, Italy Roberto S. Bigonha, Federal U of Minas Gerais, Brazil Gregor v. Bochmann, U of Ottawa, Canada Ana R. Cavalli, Telecom SudParis, France John Derrick, U of Sheffield, UK Sarolta Dibuz, Ericsson, Hungary Khaled El-Fakih, American U of Sharjah, UAE Gordon Fraser, Saarland U, Austria/Germany Wolfgang Grieskamp, Microsoft Research, USA Roland Groz, Grenoble Institute of Technology, France Toru Hasegawa, KDDI R&D Labs., Japan Klaus Havelund, Jet Propulsion Laboratory, USA Rob Hierons, Brunel U, UK Teruo Higashino, Osaka U, Japan Dieter Hogrefe, U of Gottingen, Germany Antti Huima, M.Sc. Tech, Finland Thierry Jeron, IRISA Rennes, France Ferhat Khendek, Concordia U, Canada Myungchul Kim, ICU, Korea Hartmut Konig, BTU Cottbus, Germany Victor V. Kuliamin, ISP RAS, Russia David Lee, Ohio State U, USA Bruno Legeard, Smartesting, France Patricia Machado, Federal U of Campina Grande, Brazil Giulio Maggiore, Telecom Italia Mobile, Italy Jose Carlos Maldonado, U of Sao Paulo, Brazil Eliane Martins, U of Campinas, Brazil Ana Cristina de Melo, U of Sao Paulo, Brazil Brian Nielsen, U of Aalborg, Denmark Daltro Jose Nunes, Federal U of Rio Grande do Sul, Brazil Doron Peled, U of Bar-Ilan, Israel Alexandre Petrenko, CRIM,Canada S Ramesh, General Motors India Science Lab, India Augusto Sampaio, Federal U of Pernambuco, Brazil Ina Schieferdecker, Fraunhofer FOKUS, Germany Adenilso Simao, U of Sao Paulo, Brazil Kenji Suzuki, U of Electro-Communications, Japan Jan Tretmans, Embedded Systems Institute, The Netherlands Andreas Ulrich, Siemens AG, Germany Hasan Ural, U of Ottawa, Canada M. Umit Uyar, City U of New York, USA Margus Veanes, Microsoft Research, USA Cesar Viho, IRISA Rennes, France Carsten Weise, RWTH Aachen, Germany Burkhart Wolff, U of Paris-Sud, France Nina Yevtushenko, Tomsk State U, Russia Xia Yin, Tsinghua U, China

LOCAL ORGANIZATION CHAIR Marcel Oliveira, Federal U of Rio Grande do Norte, Brazil