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Siddharth Bhatia 0001, Bryan Hooi, Leman Akoglu, Sourav Chatterjee, Xiaodong Jiang, Manish Gupta. ODD: Outlier Detection and Description. In Feida Zhu 0002, Beng Chin Ooi, Chunyan Miao, editors, KDD '21: The 27th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, Virtual Event, Singapore, August 14-18, 2021. pages 4108-4109, ACM, 2021. [doi]

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