Recognition and counting of wheat mites in wheat fields by a three-step deep learning method - researchr publication authors

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Peng Chen 0001, Weilu Li, Sijie Yao, Chun Ma, Jun Zhang 0011, Bing Wang 0004, Chunhou Zheng, Chengjun Xie, Dong Liang. Recognition and counting of wheat mites in wheat fields by a three-step deep learning method. Neurocomputing, 437:21-30, 2021. [doi]

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