Survey of public assay data: opportunities and challenges to understanding antimicrobial resistance

Akshay Agarwal 0002, Gowri Nayar, James H. Kaufman. Survey of public assay data: opportunities and challenges to understanding antimicrobial resistance. In Chih-Cheng Hung, Tomás Cerný, Dongwan Shin, Alessio Bechini, editors, SAC '20: The 35th ACM/SIGAPP Symposium on Applied Computing, online event, [Brno, Czech Republic], March 30 - April 3, 2020. pages 13-16, ACM, 2020. [doi]

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