Xin Ye 0003, Fan Fang, John Wu, Razvan C. Bunescu, Chang Liu. Bug Report Classification Using LSTM Architecture for More Accurate Software Defect Locating. In M. Arif Wani, Mehmed Kantardzic, Moamar Sayed Mouchaweh, João Gama, Edwin Lughofer, editors, 17th IEEE International Conference on Machine Learning and Applications, ICMLA 2018, Orlando, FL, USA, December 17-20, 2018. pages 1438-1445, IEEE, 2018. [doi]
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