On the Use of FOOOF for Electroencephalography Quality Measurement and Device Assessment - researchr publication authors

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Abhishek Tiwari 0003, Gloria Wu, Katrina Innanen, Amin Mahnam, Bastien Moineau, Tiago H. Falk. On the Use of FOOOF for Electroencephalography Quality Measurement and Device Assessment. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023. pages 4746-4751, IEEE, 2023. [doi]

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