More With Less: Exploring How to Use Deep Learning Effectively through Semi-supervised Learning for Automatic Bug Detection in Student Code

Yang Shi 0004, Ye Mao, Tiffany Barnes, Min Chi, Thomas W. Price. More With Less: Exploring How to Use Deep Learning Effectively through Semi-supervised Learning for Automatic Bug Detection in Student Code. In Sharon I-Han Hsiao, Shaghayegh (Sherry) Sahebi, François Bouchet, Jill-Jênn Vie, editors, Proceedings of the 14th International Conference on Educational Data Mining, EDM 2021, virtual, June 29 - July 2, 2021. International Educational Data Mining Society, 2021.

@inproceedings{0004MBCP21,
  title = {More With Less: Exploring How to Use Deep Learning Effectively through Semi-supervised Learning for Automatic Bug Detection in Student Code},
  author = {Yang Shi 0004 and Ye Mao and Tiffany Barnes and Min Chi and Thomas W. Price},
  year = {2021},
  researchr = {https://researchr.org/publication/0004MBCP21},
  cites = {0},
  citedby = {0},
  booktitle = {Proceedings of the 14th International Conference on Educational Data Mining, EDM 2021, virtual, June 29 - July 2, 2021},
  editor = {Sharon I-Han Hsiao and Shaghayegh (Sherry) Sahebi and François Bouchet and Jill-Jênn Vie},
  publisher = {International Educational Data Mining Society},
}