Bin Shen 0006, Ming Cheng, Ciwei Dong, Yixuan Xiao. Battling counterfeit masks during the COVID-19 outbreak: quality inspection vs. blockchain adoption. Int. J. Prod. Res., 61(11):3634-3650, 2023. [doi]
@article{0006CDX23,
title = {Battling counterfeit masks during the COVID-19 outbreak: quality inspection vs. blockchain adoption},
author = {Bin Shen 0006 and Ming Cheng and Ciwei Dong and Yixuan Xiao},
year = {2023},
doi = {10.1080/00207543.2021.1961038},
url = {https://doi.org/10.1080/00207543.2021.1961038},
researchr = {https://researchr.org/publication/0006CDX23},
cites = {0},
citedby = {0},
journal = {Int. J. Prod. Res.},
volume = {61},
number = {11},
pages = {3634-3650},
}