Peng Wang 0019, Robert X. Gao. Lévy Process-Based Stochastic Modeling for Machine Performance Degradation Prognosis. In IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018. pages 5936-5941, IEEE, 2018. [doi]
@inproceedings{0019G18, title = {Lévy Process-Based Stochastic Modeling for Machine Performance Degradation Prognosis}, author = {Peng Wang 0019 and Robert X. Gao}, year = {2018}, doi = {10.1109/IECON.2018.8592928}, url = {https://doi.org/10.1109/IECON.2018.8592928}, researchr = {https://researchr.org/publication/0019G18}, cites = {0}, citedby = {0}, pages = {5936-5941}, booktitle = {IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018}, publisher = {IEEE}, isbn = {978-1-5090-6684-1}, }