Supervised and semi-supervised probabilistic learning with deep neural networks for concurrent process-quality monitoring - researchr publication authors

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Kai Wang 0024, Xiaofeng Yuan, Junghui Chen, Yalin Wang 0003. Supervised and semi-supervised probabilistic learning with deep neural networks for concurrent process-quality monitoring. Neural Networks, 136:54-62, 2021. [doi]

This author has not been identified. Look up 'Kai Wang 0024' in GoogleThis author has not been identified. Look up 'Xiaofeng Yuan' in GoogleThis author has not been identified. Look up 'Junghui Chen' in GoogleThis author has not been identified. Look up 'Yalin Wang 0003' in Google

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