Robust Detection, Segmentation, and Metrology of High Bandwidth Memory 3D Scans Using an Improved Semi-Supervised Deep Learning Approach

Jie Wang 0042, Richard Chang 0002, Ziyuan Zhao, Ramanpreet Singh Pahwa. Robust Detection, Segmentation, and Metrology of High Bandwidth Memory 3D Scans Using an Improved Semi-Supervised Deep Learning Approach. Sensors, 23(12):5470, 2023. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.