Yue Jia, Mark Harman. Constructing Subtle Faults Using Higher Order Mutation Testing. Source Code Analysis and Manipulation, IEEE International Workshop on, 0, 2008. [doi]
@article{10.1109-SCAM.2008.36,
title = {Constructing Subtle Faults Using Higher Order Mutation Testing},
author = {Yue Jia and Mark Harman},
year = {2008},
doi = {10.1109/SCAM.2008.36},
url = {http://doi.ieeecomputersociety.org/10.1109/SCAM.2008.36},
tags = {testing},
researchr = {https://researchr.org/publication/10.1109-SCAM.2008.36},
cites = {0},
citedby = {0},
journal = {Source Code Analysis and Manipulation, IEEE International Workshop on},
volume = {0},
}