Z. Abazi, Pascale Thévenod-Fosse. MICROPROCESSOR BOARDS: Compact Markov Models for Random Test Length Calculation. In Fevzi Belli, Winfried Görke, editors, Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems, 3. Internationale GI/ITG/GMA-Fachtagung, Bremerhaven, 9.-11. September 1987, Proceedings. Volume 147 of Informatik-Fachberichte, pages 95-106, Springer, 1987.
@inproceedings{AbaziT87, title = {MICROPROCESSOR BOARDS: Compact Markov Models for Random Test Length Calculation}, author = {Z. Abazi and Pascale Thévenod-Fosse}, year = {1987}, tags = {testing, random testing, Markov}, researchr = {https://researchr.org/publication/AbaziT87}, cites = {0}, citedby = {0}, pages = {95-106}, booktitle = {Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems, 3. Internationale GI/ITG/GMA-Fachtagung, Bremerhaven, 9.-11. September 1987, Proceedings}, editor = {Fevzi Belli and Winfried Görke}, volume = {147}, series = {Informatik-Fachberichte}, publisher = {Springer}, isbn = {3-540-18294-2}, }