Susceptibility Analysis of LEON3 Embedded Processor against Multiple Event Transients and Upsets

Hamed Abbasitabar, Hamid R. Zarandi, Ronak Salamat. Susceptibility Analysis of LEON3 Embedded Processor against Multiple Event Transients and Upsets. In IEEE 15th International Conference on Computational Science and Engineering, CSE 2012, Paphos, Cyprus, December 5-7, 2012. pages 548-553, IEEE Computer Society, 2012. [doi]

Authors

Hamed Abbasitabar

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Hamid R. Zarandi

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Ronak Salamat

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