IGBT RBSOA non-destructive testing methods: Analysis and discussion

Carmine Abbate, Giovanni Busatto, Francesco Iannuzzo. IGBT RBSOA non-destructive testing methods: Analysis and discussion. Microelectronics Reliability, 50(9-11):1731-1737, 2010. [doi]

Authors

Carmine Abbate

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Giovanni Busatto

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Francesco Iannuzzo

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