Omar Abdelmalek, David Hély, Vincent Beroulle. Fault tolerance evaluation of RFID tags. In 15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{AbdelmalekHB14,
title = {Fault tolerance evaluation of RFID tags},
author = {Omar Abdelmalek and David Hély and Vincent Beroulle},
year = {2014},
doi = {10.1109/LATW.2014.6841902},
url = {http://dx.doi.org/10.1109/LATW.2014.6841902},
researchr = {https://researchr.org/publication/AbdelmalekHB14},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014},
publisher = {IEEE},
}