Ali Abdin. Applying self-normalizing neural networks to tackle data-driven soft sensing problems in manufacturing lines. In 2021 IEEE International Conference on Big Data (Big Data), Orlando, FL, USA, December 15-18, 2021. pages 5770-5773, IEEE, 2021. [doi]
@inproceedings{Abdin21,
title = {Applying self-normalizing neural networks to tackle data-driven soft sensing problems in manufacturing lines},
author = {Ali Abdin},
year = {2021},
doi = {10.1109/BigData52589.2021.9671496},
url = {https://doi.org/10.1109/BigData52589.2021.9671496},
researchr = {https://researchr.org/publication/Abdin21},
cites = {0},
citedby = {0},
pages = {5770-5773},
booktitle = {2021 IEEE International Conference on Big Data (Big Data), Orlando, FL, USA, December 15-18, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3902-2},
}