Rakhat Abdrakhmanov, Dmitriy Viderman, Kok Seng Wong, Minho Lee. Few-Shot Learning based on Residual Neural Networks for X-ray Image Classification. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2022, Prague, Czech Republic, October 9-12, 2022. pages 1817-1821, IEEE, 2022. [doi]
@inproceedings{AbdrakhmanovVWL22,
title = {Few-Shot Learning based on Residual Neural Networks for X-ray Image Classification},
author = {Rakhat Abdrakhmanov and Dmitriy Viderman and Kok Seng Wong and Minho Lee},
year = {2022},
doi = {10.1109/SMC53654.2022.9945469},
url = {https://doi.org/10.1109/SMC53654.2022.9945469},
researchr = {https://researchr.org/publication/AbdrakhmanovVWL22},
cites = {0},
citedby = {0},
pages = {1817-1821},
booktitle = {IEEE International Conference on Systems, Man, and Cybernetics, SMC 2022, Prague, Czech Republic, October 9-12, 2022},
publisher = {IEEE},
isbn = {978-1-6654-5258-8},
}