Hidenao Abe, Shusaku Tsumoto. Detecting Temporal Patterns of Importance Indices about Technical Phrases. In Juan D. Velásquez, Sebastián A. RÃos, Robert J. Howlett, Lakhmi C. Jain, editors, Knowledge-Based and Intelligent Information and Engineering Systems, 13th International Conference, KES 2009, Santiago, Chile, September 28-30, 2009, Proceedings, Part II. Volume 5712 of Lecture Notes in Computer Science, pages 252-258, Springer, 2009. [doi]
@inproceedings{AbeT09-3,
title = {Detecting Temporal Patterns of Importance Indices about Technical Phrases},
author = {Hidenao Abe and Shusaku Tsumoto},
year = {2009},
doi = {10.1007/978-3-642-04592-9_32},
url = {http://dx.doi.org/10.1007/978-3-642-04592-9_32},
researchr = {https://researchr.org/publication/AbeT09-3},
cites = {0},
citedby = {0},
pages = {252-258},
booktitle = {Knowledge-Based and Intelligent Information and Engineering Systems, 13th International Conference, KES 2009, Santiago, Chile, September 28-30, 2009, Proceedings, Part II},
editor = {Juan D. Velásquez and Sebastián A. RÃos and Robert J. Howlett and Lakhmi C. Jain},
volume = {5712},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-04591-2},
}