Towards fully automated testing and characterization for photonic compact modeling on 300-mm wafer platform - researchr publication authors

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Abdelsalam Aboketaf, Crystal Hedges, Vishal Dhurgude, Brendan Harris, fen Guan, Frank Pavlik, Ted Anderson, Andy Stricker, Yusheng Bian, Michal Rakowski, Arunima Dasgupta, Andrea Paganini. Towards fully automated testing and characterization for photonic compact modeling on 300-mm wafer platform. In Optical Fiber Communications Conference and Exhibition, OFC 2021, San Francisco, CA, USA, June 6-10, 2021. pages 1-3, IEEE, 2021. [doi]

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