Aleksey M. Abramov, Sergey G. Gurzhin, Vladimir I. Zhulev, Evgeniy M. Proshin. Simulation of the system for metrological examination of digital measuring modules. In 6th Mediterranean Conference on Embedded Computing, MECO 2017, Bar, Montenegro, June 11-15, 2017. pages 1-4, IEEE, 2017. [doi]
@inproceedings{AbramovGZP17,
title = {Simulation of the system for metrological examination of digital measuring modules},
author = {Aleksey M. Abramov and Sergey G. Gurzhin and Vladimir I. Zhulev and Evgeniy M. Proshin},
year = {2017},
doi = {10.1109/MECO.2017.7977162},
url = {https://doi.org/10.1109/MECO.2017.7977162},
researchr = {https://researchr.org/publication/AbramovGZP17},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {6th Mediterranean Conference on Embedded Computing, MECO 2017, Bar, Montenegro, June 11-15, 2017},
publisher = {IEEE},
isbn = {978-1-5090-6742-8},
}