Rui Abreu, Alberto González-Sanchez, Arjan J. C. van Gemund. A Diagnostic Reasoning Approach to Defect Prediction. In Kishan G. Mehrotra, Chilukuri K. Mohan, Jae C. Oh, Pramod K. Varshney, Moonis Ali, editors, Modern Approaches in Applied Intelligence - 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011, Proceedings, Part II. Volume 6704 of Lecture Notes in Computer Science, pages 416-425, Springer, 2011. [doi]
@inproceedings{AbreuGG11,
title = {A Diagnostic Reasoning Approach to Defect Prediction},
author = {Rui Abreu and Alberto González-Sanchez and Arjan J. C. van Gemund},
year = {2011},
doi = {10.1007/978-3-642-21827-9_43},
url = {http://dx.doi.org/10.1007/978-3-642-21827-9_43},
tags = {diagnostics, C++, systematic-approach},
researchr = {https://researchr.org/publication/AbreuGG11},
cites = {0},
citedby = {0},
pages = {416-425},
booktitle = {Modern Approaches in Applied Intelligence - 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011, Proceedings, Part II},
editor = {Kishan G. Mehrotra and Chilukuri K. Mohan and Jae C. Oh and Pramod K. Varshney and Moonis Ali},
volume = {6704},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-21826-2},
}