Mithun Acharya, Tanu Sharma, Jun Xu, Tao Xie. Effective Generation of Interface Robustness Properties for Static Analysis. In 21st IEEE/ACM International Conference on Automated Software Engineering (ASE 2006), 18-22 September 2006, Tokyo, Japan. pages 293-296, IEEE Computer Society, 2006. [doi]
@inproceedings{AcharyaSXX06, title = {Effective Generation of Interface Robustness Properties for Static Analysis}, author = {Mithun Acharya and Tanu Sharma and Jun Xu and Tao Xie}, year = {2006}, doi = {10.1109/ASE.2006.35}, url = {http://doi.ieeecomputersociety.org/10.1109/ASE.2006.35}, tags = {analysis, static analysis}, researchr = {https://researchr.org/publication/AcharyaSXX06}, cites = {0}, citedby = {0}, pages = {293-296}, booktitle = {21st IEEE/ACM International Conference on Automated Software Engineering (ASE 2006), 18-22 September 2006, Tokyo, Japan}, publisher = {IEEE Computer Society}, isbn = {0-7695-2579-2}, }