Peter Adamson. Optical Probing of Nanoscopic Insulating Layered Structures via Differential Characteristics of Specular Reflection of Light. In 2004 International Conference on MEMS, NANO, and Smart Systems (ICMENS 2004), 25-27 August 2004, Banff, Alberta, Canada. pages 597-603, IEEE Computer Society, 2004. [doi]
@inproceedings{Adamson04, title = {Optical Probing of Nanoscopic Insulating Layered Structures via Differential Characteristics of Specular Reflection of Light}, author = {Peter Adamson}, year = {2004}, url = {http://csdl.computer.org/comp/proceedings/icmens/2004/2189/00/21890597abs.htm}, tags = {reflection}, researchr = {https://researchr.org/publication/Adamson04}, cites = {0}, citedby = {0}, pages = {597-603}, booktitle = {2004 International Conference on MEMS, NANO, and Smart Systems (ICMENS 2004), 25-27 August 2004, Banff, Alberta, Canada}, publisher = {IEEE Computer Society}, isbn = {0-7695-2189-4}, }