Reducing test time via an optimal selection of LFSR feedback taps

Ahmad Afaq, Ali Al-Lawati. Reducing test time via an optimal selection of LFSR feedback taps. In Proceedings of the Sixth International Symposium on Signal Processing and its Applications, ISSPA 2001, August 13-16 2001, Shmgri-La Hotel, Kuala Lumpur, Malaysia. pages 300-303, IEEE, 2001. [doi]

@inproceedings{AfaqA01,
  title = {Reducing test time via an optimal selection of LFSR feedback taps},
  author = {Ahmad Afaq and Ali Al-Lawati},
  year = {2001},
  doi = {10.1109/ISSPA.2001.949837},
  url = {http://dx.doi.org/10.1109/ISSPA.2001.949837},
  researchr = {https://researchr.org/publication/AfaqA01},
  cites = {0},
  citedby = {0},
  pages = {300-303},
  booktitle = {Proceedings of the Sixth International Symposium on Signal Processing and its Applications, ISSPA 2001, August 13-16 2001, Shmgri-La Hotel, Kuala Lumpur, Malaysia},
  publisher = {IEEE},
  isbn = {0-7803-6703-0},
}