Ayushi Agarwal, Pankaj Gupta, Atul Gupta. Advanced Regression Management for Post-Silicon Validation of Automotive SOCs. In 19th International Workshop on Microprocessor and SOC Test and Verification, MTV 2018, Austin, TX, USA, December 9-10, 2018. pages 56-60, IEEE, 2018. [doi]
@inproceedings{AgarwalGG18-0,
title = {Advanced Regression Management for Post-Silicon Validation of Automotive SOCs},
author = {Ayushi Agarwal and Pankaj Gupta and Atul Gupta},
year = {2018},
doi = {10.1109/MTV.2018.00021},
url = {https://doi.org/10.1109/MTV.2018.00021},
researchr = {https://researchr.org/publication/AgarwalGG18-0},
cites = {0},
citedby = {0},
pages = {56-60},
booktitle = {19th International Workshop on Microprocessor and SOC Test and Verification, MTV 2018, Austin, TX, USA, December 9-10, 2018},
publisher = {IEEE},
isbn = {978-1-5386-9250-9},
}