Ritu Agarwal, Jayesh Prasad, Mohan Tanniru, John Lynch. Risks of rapid application development. Communications of the ACM, 43(11es):1, 2000. [doi]
@article{AgarwalPTL00,
title = {Risks of rapid application development},
author = {Ritu Agarwal and Jayesh Prasad and Mohan Tanniru and John Lynch},
year = {2000},
doi = {10.1145/352515.352516},
url = {http://doi.acm.org/10.1145/352515.352516},
researchr = {https://researchr.org/publication/AgarwalPTL00},
cites = {0},
citedby = {0},
journal = {Communications of the ACM},
volume = {43},
number = {11es},
pages = {1},
}