Fake News Detection: An Investigation based on Machine Learning

Payal Agarwal, Sandeep Reddivari, Kalyan Reddivari. Fake News Detection: An Investigation based on Machine Learning. In 23rd IEEE International Conference on Information Reuse and Integration for Data Science, IRI 2022, San Diego, CA, USA, August 9-11, 2022. pages 61-62, IEEE, 2022. [doi]

Authors

Payal Agarwal

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Sandeep Reddivari

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Kalyan Reddivari

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