Y. Q. de Aguiar, Laurent Artola, Guillaume Hubert, Cristina Meinhardt, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis. Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology. Microelectronics Reliability, 76:660-664, 2017. [doi]
@article{AguiarAHMKR17,
title = {Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology},
author = {Y. Q. de Aguiar and Laurent Artola and Guillaume Hubert and Cristina Meinhardt and Fernanda Lima Kastensmidt and Ricardo Augusto da Luz Reis},
year = {2017},
doi = {10.1016/j.microrel.2017.06.077},
url = {https://doi.org/10.1016/j.microrel.2017.06.077},
researchr = {https://researchr.org/publication/AguiarAHMKR17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {660-664},
}