Henrique Tavares Aguiar, Raimundo C. S. Vasconcelos. Identification of External Defects on Fruits Using Deep Learning. In Armando J. Pinho, Petia Georgieva, Luís F. Teixeira 0001, Joan-Andreu Sánchez, editors, Pattern Recognition and Image Analysis - 10th Iberian Conference, IbPRIA 2022, Aveiro, Portugal, May 4-6, 2022, Proceedings. Volume 13256 of Lecture Notes in Computer Science, pages 565-575, Springer, 2022. [doi]
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