Ali Ahari, Alexander Viehl, Oliver Bringmann 0001, Wolfgang Rosenstiel. Mission profile-based assessment of semiconductor technologies for automotive applications. Microelectronics Reliability, 91:129-138, 2018. [doi]
@article{AhariV0R18,
title = {Mission profile-based assessment of semiconductor technologies for automotive applications},
author = {Ali Ahari and Alexander Viehl and Oliver Bringmann 0001 and Wolfgang Rosenstiel},
year = {2018},
doi = {10.1016/j.microrel.2018.08.008},
url = {https://doi.org/10.1016/j.microrel.2018.08.008},
researchr = {https://researchr.org/publication/AhariV0R18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {91},
pages = {129-138},
}