Bahar Ahmadi, Pouya Tavousi, Joseph Favata, Peiman Shahbeigi-Roodposhti, Rengarajan Pelapur, Sina Shahbazmohamadi. A novel crowdsourcing platform for microelectronics counterfeit defect detection. Microelectronics Reliability, 88:48-53, 2018. [doi]
@article{AhmadiTFSPS18,
title = {A novel crowdsourcing platform for microelectronics counterfeit defect detection},
author = {Bahar Ahmadi and Pouya Tavousi and Joseph Favata and Peiman Shahbeigi-Roodposhti and Rengarajan Pelapur and Sina Shahbazmohamadi},
year = {2018},
doi = {10.1016/j.microrel.2018.07.107},
url = {https://doi.org/10.1016/j.microrel.2018.07.107},
researchr = {https://researchr.org/publication/AhmadiTFSPS18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {88},
pages = {48-53},
}