Design and test of a high power IGBT non-destructive tester

Ashraf Ahmed, Alberto Castellazzi, L. Coulbeck, M. C. Johnson. Design and test of a high power IGBT non-destructive tester. In 21st IEEE International Symposium on Industrial Electronics, ISIE 2012, Hangzhou, China, 28-31 May, 2012. pages 292-297, IEEE, 2012. [doi]

Authors

Ashraf Ahmed

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Alberto Castellazzi

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L. Coulbeck

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M. C. Johnson

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