Jae Young Ahn, Gyeonghwan Kim. Application of optimal clustering and metric learning to patch-based anomaly detection. Pattern Recognition Letters, 154:110-115, 2022. [doi]
@article{AhnK22-0,
title = {Application of optimal clustering and metric learning to patch-based anomaly detection},
author = {Jae Young Ahn and Gyeonghwan Kim},
year = {2022},
doi = {10.1016/j.patrec.2022.01.017},
url = {https://doi.org/10.1016/j.patrec.2022.01.017},
researchr = {https://researchr.org/publication/AhnK22-0},
cites = {0},
citedby = {0},
journal = {Pattern Recognition Letters},
volume = {154},
pages = {110-115},
}