Dror Aiger, Hugues Talbot. The phase only transform for unsupervised surface defect detection. In The Twenty-Third IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2010, San Francisco, CA, USA, 13-18 June 2010. pages 295-302, IEEE, 2010. [doi]
@inproceedings{AigerT10,
title = {The phase only transform for unsupervised surface defect detection},
author = {Dror Aiger and Hugues Talbot},
year = {2010},
doi = {10.1109/CVPR.2010.5540198},
url = {http://dx.doi.org/10.1109/CVPR.2010.5540198},
researchr = {https://researchr.org/publication/AigerT10},
cites = {0},
citedby = {0},
pages = {295-302},
booktitle = {The Twenty-Third IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2010, San Francisco, CA, USA, 13-18 June 2010},
publisher = {IEEE},
}