Robert C. Aitken. DFM: The Real 90nm Hurdle. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1313, IEEE Computer Society, 2003. [doi]
@inproceedings{Aitken03, title = {DFM: The Real 90nm Hurdle}, author = {Robert C. Aitken}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20631313.pdf}, tags = {C++}, researchr = {https://researchr.org/publication/Aitken03}, cites = {0}, citedby = {0}, pages = {1313}, booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA}, publisher = {IEEE Computer Society}, isbn = {0-7803-8106-8}, }