A Chip Integrity Monitor for Evaluating Moisture/Ion Ingress in mm-Sized Single-Chip Implants

Omer Can Akgun, Kambiz Nanbakhsh, Vasiliki Giagka, Wouter A. Serdijn. A Chip Integrity Monitor for Evaluating Moisture/Ion Ingress in mm-Sized Single-Chip Implants. IEEE Trans. Biomed. Circuits and Systems, 14(4):658-670, 2020. [doi]

Authors

Omer Can Akgun

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Kambiz Nanbakhsh

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Vasiliki Giagka

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Wouter A. Serdijn

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