Zaid Al-Ars, Said Hamdioui, A. J. van de Goor. Space of DRAM fault models and corresponding testing. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 1252-1257, European Design and Automation Association, Leuven, Belgium, 2006. [doi]
@inproceedings{Al-ArsHG06,
title = {Space of DRAM fault models and corresponding testing},
author = {Zaid Al-Ars and Said Hamdioui and A. J. van de Goor},
year = {2006},
doi = {10.1145/1131829},
url = {http://doi.acm.org/10.1145/1131829},
tags = {testing},
researchr = {https://researchr.org/publication/Al-ArsHG06},
cites = {0},
citedby = {0},
pages = {1252-1257},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006},
editor = {Georges G. E. Gielen},
publisher = {European Design and Automation Association, Leuven, Belgium},
isbn = {3-9810801-0-6},
}