Zaid Al-Ars, Said Hamdioui, Georg Mueller, A. J. van de Goor. Framework for Fault Analysis and Test Generation in DRAMs. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 1020-1021, IEEE Computer Society, 2005. [doi]
@inproceedings{Al-ArsHMG05,
title = {Framework for Fault Analysis and Test Generation in DRAMs},
author = {Zaid Al-Ars and Said Hamdioui and Georg Mueller and A. J. van de Goor},
year = {2005},
doi = {10.1109/DATE.2005.161},
url = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.161},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/Al-ArsHMG05},
cites = {0},
citedby = {0},
pages = {1020-1021},
booktitle = {2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany},
publisher = {IEEE Computer Society},
isbn = {0-7695-2288-2},
}