Analysis of the soft error susceptibility and failure rate in logic circuits

Eman AlQuraishi, May Al-Roomi, Sobeeh Almukhaizim. Analysis of the soft error susceptibility and failure rate in logic circuits. Int. Arab J. Inf. Technol., 8(4):388-396, 2011. [doi]

Authors

Eman AlQuraishi

This author has not been identified. Look up 'Eman AlQuraishi' in Google

May Al-Roomi

This author has not been identified. Look up 'May Al-Roomi' in Google

Sobeeh Almukhaizim

This author has not been identified. Look up 'Sobeeh Almukhaizim' in Google