A comparison by simulation and by measurement of the substrate noise generated by CMOS, CSL, and CBL digital circuits

Edgar F. M. Albuquerque, Manuel Medeiros Silva. A comparison by simulation and by measurement of the substrate noise generated by CMOS, CSL, and CBL digital circuits. IEEE Trans. on Circuits and Systems, 52-I(4):734-741, 2005. [doi]

@article{AlbuquerqueS05-0,
  title = {A comparison by simulation and by measurement of the substrate noise generated by CMOS, CSL, and CBL digital circuits},
  author = {Edgar F. M. Albuquerque and Manuel Medeiros Silva},
  year = {2005},
  doi = {10.1109/TCSI.2005.844110},
  url = {http://dx.doi.org/10.1109/TCSI.2005.844110},
  researchr = {https://researchr.org/publication/AlbuquerqueS05-0},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on Circuits and Systems},
  volume = {52-I},
  number = {4},
  pages = {734-741},
}