Muhammad Ali, Mohammad A. Ahmed, Malgorzata Chrzanowska-Jeske. TSV stress-aware performance and reliability analysis. In 19th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2012, Seville, Spain, December 9-12, 2012. pages 737-740, IEEE, 2012. [doi]
@inproceedings{AliAC12,
title = {TSV stress-aware performance and reliability analysis},
author = {Muhammad Ali and Mohammad A. Ahmed and Malgorzata Chrzanowska-Jeske},
year = {2012},
doi = {10.1109/ICECS.2012.6463649},
url = {http://dx.doi.org/10.1109/ICECS.2012.6463649},
researchr = {https://researchr.org/publication/AliAC12},
cites = {0},
citedby = {0},
pages = {737-740},
booktitle = {19th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2012, Seville, Spain, December 9-12, 2012},
publisher = {IEEE},
isbn = {978-1-4673-1259-2},
}